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Sang Ho Oh's Lab
See the unseen with electron microscope!
About
Using the state-of-the-art electron microscope, we trace the dynamic motions of atoms, ions and electron in real-time with picometer precision during the energy generation and transfer processes to reveal the fundamental mechanisms and provide a clue to the design of new energy materials.
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Research
In-situ TEM
In-situ Transmission Electron Microscopy (TEM) enables real-time visualization of materials at the atomic to nanoscale while they are subjected to controlled external stimuli such as temperature changes, electrical biasing, mechanical stress, or reactive environments. By directly observing dynamic processes such as phase transitions, defect migration, and interface evolution, this technique provides insights that static imaging cannot capture, allowing researchers to establish clear links between structural changes and functional properties. Our laboratory leverages advanced in-situ TEM holders and high-resolution imaging, diffraction, and spectroscopy to investigate fundamental mechanisms in functional materials, guiding the design of next-generation electronic, optoelectronic, and energy devices.
Deep Learning-based 4D-STEM
Deep learning-based four-dimensional scanning transmission electron microscopy (4D-STEM) leverages neural networks to rapidly and accurately analyze the vast diffraction datasets generated by recording a two-dimensional pattern at each probe position during a scan. This approach enhances tasks such as strain mapping, phase identification, electric field reconstruction, and defect detection, offering greater robustness under low signal conditions. By integrating advanced algorithms with 4D-STEM, our laboratory achieves faster, more reliable insights into the structural and functional behavior of materials, enabling real-time analysis and the discovery of otherwise hidden phenomena.
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